International Dimensional Workshop
KEYNOTE ADDRESS: "Dimensional Metrology For Functional Control"
May 10-14, 2004 – Nashville, Tennessee
The 2004 International Dimensional Workshop was themed "Dimensional Metrology for Functional Control". This keynote address of the same title discusses a 4th generation approach to dimensional measurement whereby instead of reporting dimensional results, the measurands are those of functional attributes. Examples of simulating product functionality within existing dimensional measuring systems are presented along with methodologies for for extending this approach.